1.4 Mega pixel CCD Beam Profiler 12 Bit resolution |
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Expanding your profiling capabilities. High resolution CCD having 12 Bit true dynamic range. A complete test station measuring Profile, Power and Position, both for CW and Pulsed beams. Based on a USB 2.0 interface for notebooks. Offered with a complete set for larger beams and high power attenuation. The system comes with a camera, a standard USB 2.0 cable, a post, a set of 3xND filters in housing, power supply 6V DC, software on CD disk and carrying case.
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(419K)
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| BeamOnHR | Complete system with camera and USB 2.0 cable, a post, a set of 3xND filters in housing, power supply, software and carrying case. |
Accessories: | |
| SAM1: | Beam sampler (ratio: 3x10-3) |
| SAM2: | Beam sampler (ratio: 1x10-6) |
| RDC: | Beam reducer (ratio: 2.5x1) |
| MountB: | Mounting base |
| ND-FILT: | 1/8 ND filter, M37x0.75 |
| NG-Filters: | 1.6mm think Schott colored filter in mount with adapter, types: NG4/Ng9/NG10 |
| Acc-Set: | Full set of accessories (see sketch) |
CCD Beam Profiler |
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Expanding your profiling capabilities. Complete system for Laser Beam Analysis, composed of a CCD camera head, a set of 3xNG Schott colored filters (NG4, NG9, NG10) in housing, a PCI card or a USB 2.0 attachment, software on CD disk, carrying case, user manual. Select PC interface when ordering. NEW ! A line of beam sampling accessories recently introduced, enabling a wider range of power levels, from nanoWatts to hundreds of Watts. NEW ! A beam reducer attachment enabling measurements of beams with diameters from 100µm and up to 16mm X 12mm.
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| BeamOn-VIS: | Complete system with plug-in PCI card or USB 2.0 adapter, a VIS camera range 350-1100nm |
| BeamOn-IR-1310: | Complete system with plug-in PCI card or USB 2.0 adapter, an IR camera range 350-1310nm |
| BeamOn-UV: | Complete system with plug-in PCI card or USB 2.0 adapter, a UV camera range 190-1100nm |
| BeamOn-IR-1550: | Complete system with plug-in PCI card or USB 2.0 adapter, an IR camera range 350-1310nm, and 1550nm (+/- 50nm) |
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The analyzer for microscopic beams. Complete system including a Stand Alone operating console, a measuring station composed of a CCD type detector and supplementary high magnification optics. The standard configuration is composed of a mounting base support for the CCD and optics, where an optional configuration is a microscope type adjusting device. Alternatively, the system is offered with USB2.0 interface. Main features include: measure beam of less than 0.5µm (FWHM), handles CW or pulses, having a long working distance, using a high resolution CCD response range, optical zooming for fast beam finding. Measured parameters: Intensity profiles, beam position and beam shape.
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µBeam-X-USB2.0: µBeam-X-SA: X: |
Complete system based on a USB 2.0 interface. Complete system based on Stand-Alone unit. Select type of lens: x10, x20, x50, x100 |
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The analyzer for large or small beams from remote. Complete system including a measuring head composed of a CCD type detector with USB2.0 interface and a mounting base support for the measuring head. Main features include: measure laser beams from remote, handles CW or pulses, motorized zooming function for best beam capture, Autofocus function, measures UV beams through a conversion plate.
Measured parameters: Intensity profiles, beam position and beam shape.
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| BeamOn-LB: | Complete system based on a USB 2.0 interface. |
Multiple Scanning Knife-Edge Beam Profiler with USB interface |
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Expanding your profiling capabilities. The new USB version offers enhanced operation of BeamAnalyzer series, including: USB 2.0 interface, 12 bit device, high resolution sampling for all blades simultaneously, Windows XP/Vista OS. High accuracy multiple knife-edge beam profiler. Wide spectral range from deep UV through 1800nm. Wide dynamic range, beam size measurements down to 2 µm size and up to 10mm. The system composed of a External USB 2.0 box, a measuring head, a set of 2xNG Schott colored filters (NG4, NG9) in housing for Si and UV-Si detectors, a post, Windows application software on CD disk, carrying case, user manual.
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| BA3-USB-Si: | 3-blades Si detector 5 mm circular, range 350-1100nm |
| BA7-USB-Si: | 7-blades Si detector 9 mm square, range 350-1100nm |
| BA3-USB-UV: | 3-blades UV-Si detector 5 mm circular, range 190-1100nm |
| BA7-USB-UV: | 7-blades UV-Si detector 9 mm square, range 190-1100nm |
| BA3-USB-IR3: | 3-blades InGaAs detector 3 mm circular, range 800-1800nm |
| BA7-USB-IR3: | 7-blades InGaAs detector 3 mm circular, range 800-1800nm |
| BA3-USB-IR5: | 3-blades InGaAs detector 5 mm circular, range 800-1800nm |
| BA7-USB-IR5: | 7-blades InGaAs detector 5 mm circular, range 800-1800nm |
Multiple Scanning Knife-Edge Beam Profiler |
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Expanding your profiling capabilities. High accuracy multiple knife-edge beam profiler. Wide spectral range from deep UV through 1800nm. Wide dynamic range, beam size measurements down to 2 µm size and up to 10mm. The system composed of a PCI plug-in card, a measuring head, a set of 2xNG Schott colored filters (NG4, NG9) in housing for Si and UV-Si detectors, a post, Windows application software on CD disk, carrying case, user manual.
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| BA3-Si: | 3-blades Si detector 5 mm circular, range 350-1100nm |
| BA7-Si: | 7-blades Si detector 9 mm square, range 350-1100nm |
| BA3-UV: | 3-blades UV-Si detector 5 mm circular, range 190-1100nm |
| BA7-UV: | 7-blades UV-Si detector 9 mm square, range 190-1100nm |
| BA3-IR3: | 3-blades InGaAs detector 3 mm circular, range 800-1800nm |
| BA7-IR3: | 7-blades InGaAs detector 3 mm circular, range 800-1800nm |
| BA3-IR5: | 3-blades InGaAs detector 5 mm circular, range 800-1800nm |
| BA7-IR5: | 7-blades InGaAs detector 5 mm circular, range 800-1800nm |
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A versatile multi-function beam analysis system. Complete system including a measuring head mounted on a scanning waist assembly and a stand alone control unit (button operated with 2 X LCD displays). An external VGA screen can be connected to the unit for graphical presentation. The unit contains an RS232 port for communication with another computer, as well as a FDD for data storing.
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M2-Beam-Si: M2-Beam-IR-3mm: M2-Beam-IR-5mm: M2-Beam-UV: |
7-blades profiler head, Si type 10mmX10mm detector 7-blades profiler head, InGaAs-3mm diameter detector 7-blades profiler head, InGaAs-5mm diameter detector 7-blades profiler head, UV-Enhanced 10mmX10mm detector |
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Laser beam divergence meter. Complete system including a measuring head mounted on a scanning waist attachment and a Stand Alone control unit (button operated with 2 X LCD displays).An external VGA screen can be connected to the unit for full graphical presentation. The unit contains an RS232 port for communication with another computer, as well as a FDD for data storing. There are two optional configurations: Option A – Moving retro-reflector, fixed source Option B – Moving source Measured parameters: 2-Axis beam N.A. (in mRad), waist location, beam divergence. Also profile width, position and power at an intersection cut along the beam propagation axis.
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FG-Si: FG-InGaAs-3mm: FG-InGaAs-5mm: FG-UV: |
7-blades profiler head, Si type 10mmX10mm detector 7-blades profiler head, InGaAs-3mm diameter detector 7-blades profiler head, InGaAs-5mm diameter detector 7-blades profiler head, UV-Enhanced 10mmX10mm detector |
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A characterization instrument for the angular radiation intensity of light. A Goniometric radiometer for fiber / diode analysis. Complete system including a Stand Alone operating console, a scan unit with attachments for fiber optic or laser diode, software package installed on console unit. External VGA screen can be connected for full graphical presentation. Measured parameters: 2-axis N.A., angular propagation, beam profile and beam power at an intersection point along the propagation axis.
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FiberAlyzer-InGaAs: FiberAlyzer-Si:: |
Complete system based on an InGaAs-5mm diameter detector
Complete system based on a Si 10mmX10mm detector |
